Abstract:
We present a statistical analysis of the measurement noise of a atom interferometer (AI) under large phase and contrast noise caused by rotation fluctuations. The extraction of the standard deviation of the contrast fluctuations out of transition probability measurements allows us to determine the level of rotation noise applied to the onboard instrument. We include an experimental validation of the method.
Authors: B. Kaczmarczuk, J. Gomes Baptista, S. Merlet, L. A. Sidorenkov, Q. Beaufils and F. Pereira Dos Santos
Publication location: IEEE Sensors Journal
Date of publication: 15 August 2025
D.O.I: https://doi.org/10.1109/JSEN.2025.3586409
How to cite this article: B. Kaczmarczuk, J. Gomes Baptista, S. Merlet, L. A. Sidorenkov, Q. Beaufils and F. Pereira Dos Santos, “Statistical Analysis of the Rotation Induced Decay of the Contrast in an Onboard Atom Interferometer,” in IEEE Sensors Journal, vol. 25, no. 16, pp. 30889-30896, 15 Aug.15, 2025, doi: 10.1109/JSEN.2025.3586409.
